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fib-mill-controller

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Focused Ion Beam milling skill for site-specific nanofabrication and cross-section preparation

QUICK START

How to use this skill

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  3. Review the proposed files and risks before you approve installation.
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I want to install this Agent Skill for this project in Codex.

Source SKILL.md: https://github.com/a5c-ai/babysitter/blob/HEAD/library/specializations/domains/science/nanotechnology/skills/fib-mill-controller/SKILL.md

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Copying this prompt does not install or run the skill. Review third-party files before use. Codex skill guide

FIB Mill Controller

Purpose

The FIB Mill Controller skill provides focused ion beam process control for site-specific nanofabrication and sample preparation, enabling precise material removal and deposition at the nanoscale.

Capabilities

  • TEM lamella preparation
  • Nanoscale milling and deposition
  • Pattern writing and editing
  • Cross-section imaging
  • Gas-assisted etching/deposition
  • Damage minimization protocols

Usage Guidelines

FIB Processing

  1. TEM Lamella Preparation

    • Deposit protective cap
    • Rough mill with high current
    • Fine polish to target thickness

  2. Nanofabrication

    • Define pattern geometry
    • Optimize beam parameters
    • Minimize gallium implantation

  3. Circuit Editing

    • Navigate to target location
    • Selective material removal
    • Metal deposition for reconnection

Process Integration

  • Nanodevice Integration Process Flow
  • Multi-Modal Nanomaterial Characterization Pipeline

Input Schema

{
  "operation": "lamella|milling|deposition|cross_section",
  "material": "string",
  "target_thickness": "number (nm, for lamella)",
  "pattern_file": "string (for milling)",
  "beam_voltage": "number (kV)"
}

Output Schema

{
  "process_parameters": {
    "beam_current": "number (pA)",
    "dwell_time": "number (us)",
    "overlap": "number (%)"
  },
  "milling_depth": "number (nm)",
  "lamella_thickness": "number (nm)",
  "damage_layer": "number (nm)",
  "processing_time": "number (minutes)"
}