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afm-spm-analyzer

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Atomic Force Microscopy and Scanning Probe Microscopy skill for nanoscale topography, mechanical, and electrical property mapping

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How to use this skill

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Source SKILL.md: https://github.com/a5c-ai/babysitter/blob/HEAD/library/specializations/domains/science/nanotechnology/skills/afm-spm-analyzer/SKILL.md

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AFM-SPM Analyzer

Purpose

The AFM-SPM Analyzer skill provides comprehensive atomic force and scanning probe microscopy data analysis for nanoscale surface characterization, including topography, mechanical properties, and electrical measurements.

Capabilities

  • Topography imaging and analysis
  • Surface roughness calculation (Ra, RMS)
  • Force-distance curve analysis
  • Nanoindentation and mechanical mapping
  • Kelvin probe force microscopy (KPFM)
  • Conductive AFM measurements

Usage Guidelines

AFM Analysis Workflow

  1. Topography Analysis

    • Apply plane leveling corrections
    • Remove artifacts and noise
    • Calculate roughness parameters

  2. Mechanical Mapping

    • Calibrate cantilever spring constant
    • Apply contact mechanics models
    • Generate modulus maps

  3. Electrical Measurements

    • Calibrate work function reference
    • Map surface potential
    • Measure local conductivity

Process Integration

  • Multi-Modal Nanomaterial Characterization Pipeline
  • In-Situ Characterization Experiment Design
  • Thin Film Deposition Process Optimization

Input Schema

{
  "data_file": "string",
  "analysis_type": "topography|force_curves|mechanical|electrical",
  "cantilever_specs": {
    "spring_constant": "number (N/m)",
    "tip_radius": "number (nm)"
  }
}

Output Schema

{
  "topography": {
    "Ra": "number (nm)",
    "RMS": "number (nm)",
    "Rmax": "number (nm)",
    "image_path": "string"
  },
  "mechanical": {
    "modulus": "number (GPa)",
    "adhesion": "number (nN)",
    "deformation": "number (nm)"
  },
  "electrical": {
    "surface_potential": "number (mV)",
    "work_function": "number (eV)"
  }
}